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JT 57××/RMIC

The new-concept, industrial JTAG-powered PCB tester-programmer the JT 57xx/RMIc ‘CombiSystem’ comprises a sleek base-level 19″ rack-mount chassis assembly that can house up to four customer-specified modules chosen from various JTAG (IEEE 1149.x) controllers, digital IO and analog IO and other measurement modules.

Each of the modules offer similar specifications to their bench-top equivalents but benefit from higher channel and TAP density, smaller footprint and lower overall cost. By mixing and matching the modules users can configure almost any type of JTAG/boundary-scan tester-programmer that might be needed to build the most cost-effective solution.

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    תיאור מוצר

    The modules are either ½ rack or ¼ rack width and are available as follows:

    JT 5705/RMIc  module (¼ width)

      • 2 TAPs (15MHz)
      • 64 mixed signal IO (MIOS) channels

    JT 37×7/RMIc  module  (½ width)

      • 4 TAPs(40MHz)
      • 16 static IO channels
      • optionally 64 DIOS channels (DIO-64 version only)

    JT 5112/RMIc  module (¼ width)

      • 64 mixed signal IO (MIOS) channels

    JT 5111/RMIc  module (¼ width)

      • 64 digital IO (DIOS) channels

    Features

    • Four module slots for controller, digital IO or MIOS
    • Up to 256 I/O channels and eight TAPs in total
    • High-speed (15MHz) and ultra-high-speed (40MHz) controller options
    • Measurement options for frequency, pulse-width and VDC (analog)
    • Analog source and clock generator

    Benefits

    • Configure your optimum tester/programmer
    • Supports analog and digital I/O channels
    • Front panel output for all test signals
    • User configurable features via embedded FPGA
    • Compact 1U 19″ chassis

    Applications

    Testing and programming of medium to high complexity mixed signal designs,

    Integration into functional ATE test-sets.

    Specifications

    JT 5705/RMIc (1/4 width)

    • Two 1149.x compliant Test Access Ports
    • TCK up to 15 MHz
    • Auto Write signal for fast flash programming
    • 64 I/O channels
    • 8 Analog Input and/or Output channels (taken from 64 above)
    • Generated value has an accuracy of +/- 0.45%
    • Measured value has an accuracy of +/- (0.4% + 100mV)
    • Analog range 0 to + 30.0 or ± 15.0V
    • Frequency generator
    • Pulse width counter
    • Frequency measurements to 128 MHz

    JT 37×7/RMIc-DIO-0 (1/2 width)

    • Four 1149.x compliant Test Access Ports
    • TCK up to 40 MHz continuous
    • 16 static I/Os
    • ETT technology for fast flash programming
    • Configurable flash image buffer

    JT 37×7/RMIc-DIO-64 (1/2 width)

    • Four 1149.x compliant Test Access Ports
    • TCK up to 40 MHz continuous
    • 64 I/O scan channels
    • 16 static I/Os
    • ETT technology for fast flash programming
    • Configurable flash image buffer

    JT 5112/RMIc (1/4 width)

    • 64 I/O channels
    • 8 Analog Input or Output channels (taken from 64 above)
    • Generated value has an accuracy of +/- 0.45%
    • Measured value has an accuracy of +/- (0.4% + 100mV)
    • Analog range + 30.0V or ± 15.0V
    • Frequency measurements to 128 MHz
    • Frequency Generator
    • Pulse width counter

    JT 5111/RMIc (1/4 width)

    • 64 Digital I/O channels
    • Digital output range (1.0 – 3.6 V)

    הורדות

    2111-JT57xx-RMIc-E הורדה

    איך אפשר לעזור?

    חייגו אלינו: 036450780

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