I-V/C-V Meter Keithley 4210

I-V/C-V Meter Keithley 4210

The 4200A-SCS Parameter Analyzer will help you to accelerate research, reliability and failure analysis studies of semiconductor devices, materials and process development.

The highest performance of the parameter analyzer will deliver synchronizing current-voltage (I-V), capacitance-voltage (C-V) and ultra-fast pulsed I-V measurements.

The 4200A-SCS Parameter Analyzer reduces the time from setup to running characterization tests by up to 50%, allowing uncompromised measurement and analysis capability.

Plus, embedded measurement expertise provides unparalleled test guidance and gives supreme confidence in the resulting measurements.

Manufacturer and model:

Keithley 4200A I-V/C-V meter

Description:

Electrical test system, integrating multiple DC source/meter units, AC impedance meter, interactive software, graphics, and analysis capabilities,

simplifying sensitive current-voltage (I-V) and capacitance-voltage (C-V) measurements.

Specification:

Parameter Analyze with the following units:

• Source measure units: I-V DC sources (±200V, 1A)/I and V meters.
• Preamp for SMUs, adds 5 ranges with 10aA resolution.
• Capacitance-voltage unit: AC impedance meter, 1kHz to 10MHz, 100mV AC Drive.
• Multi-Switch: Enables switching between I-V and C-V measurements.

A dedicated manual probing solution for low-noise I-V/C-V tests

• 150 mm chuck stage, universal platen with 40 mm height adjustment.
• Triax probe arms, 2 m triax cables, 6 μm tip radius probe tips.
• Stereo zoom microscope: 15x – 100x magnification and LED illumination.

Applications:

•  Device modeling.
•  Process development.
• Characterization.
•  Reliability.
•  Lifetime testing.
•  Failure analysis, etc.

Materials:

Semiconductors, Organic semiconductors, Metals, Semimetals, Oxides, transparent conductive oxides, Nanocomposites, Metamaterials, 2D materials, etc.

Devices:

• Resistors (thermo, 4point, Hall bar, Wan der Pauw, magneto, etc.).
• Capacitors (MOS, MIS, MIMs, CCDs).
• Diodes (PN, PIN, Zener, avalanche, Schottky, photodiodes, solar cells).
• Transistors (MOSFET, HFET, TFFET, BJT, OFET, BioFETs,  HEMT, etc.).
• Memory devices.
• MEMS devices
• Image sensors.
• Bio sensors, etc.

Location: Engineering Cleanroom, Wolfson building Electrical Engineering.

Tool Owner:Anastasia Adelberg ([email protected]),Tool Trainer:Gregory Kopnov ([email protected]).