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בואו נפגש!קפה טוב עלינו צרו קשר
דלג לתוכן הראשי
KEITHLEY
05 יונ, 2024

Device Characterization with Parameters Analyzers

Whether you are a researcher, engineer, or professional involved in semiconductor device development, this webinar is a must-attend event to enhance your knowledge and optimize your characterization processes.
פורסם על ידי: RDT 05 יונ, 2024
Device Characterization with Parameters Analyzers

In this webinar, you will have the opportunity to:
• Gain a comprehensive understanding of parameter analyzers and their role in device characterization.
• Explore the features and capabilities of the Keithley 4200A-SCS parameter analyzer.
• Learn how to effectively utilize the Keithley 4200A-SCS to accelerate semiconductor devices, materials, and process development.
• Discover best practices for reducing characterization complexity and obtaining clear and accurate results.
• Engage in live demonstrations and practical examples showcasing the power of parameter analyzers.
• Interact with industry experts and ask questions during the dedicated Q&A session.

 

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חייגו אלינו: 036450780

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